New angle on x-ray measurements

9 marzo 2015

Criminal justice, cosmology and computer manufacturing may not look to have much in common, but these and many other disparate fields all depend on sensitive measurement of X-rays. Scientists have developed a new method to reduce uncertainty in X-ray wavelength measurement that could provide improvements awaited for decades. Accurate measurement of X-ray wavelength depends critically on the ability to measure angles very accurately and with very little margin for error.