20 octubre 2014
Scientists have used atomic-resolution Z-contrast imaging and X-ray spectroscopy in a scanning transmission electron microscope to explore dislocations in the binary II-VI semiconductor CdTe, commercially used in thin-film photovoltaics. The results may lead to eventual improvement in the conversion efficiency of CdTe solar cells. These novel insights into atomically resolved chemical structure of dislocations have potential for understanding many more defect-based phenomena.
http://feeds.sciencedaily.com/~r/sciencedaily/~3/RBfyZ5BMVyU/141020105331.htm
