10 agosto 2015
To gain even deeper insights into the smallest of worlds, the thresholds of microscopy must be expanded further. Scientists have succeeded in combining two established measurement techniques for the first time: near-field optical microscopy and ultra-fast spectroscopy. Computer-assisted technology developed especially for this purpose combines the advantages of both methods and suppresses unwanted noise. This makes highly precise filming of dynamic processes at the nanometer scale possible.
http://www.sciencedaily.com/releases/2015/08/150810091731.htm
